¡ñ Precise and stable horizontal and vertical linearity with horizontal linearity 0.1% and vertical linearity 2%. ¡ñ DAC¡¢AVG ¡¢DGS curves and defect echo help to evaluate defect equivalent calculation. ¡ñ Simultaneous display of high resolution A-scan and B-scan waveform. ¡ñ Four ways to present waveform: positive half-wave, negative half- wave, full wave and radio frequency.
 ¡ñ Automatic gain adjustment, defect equivalent calculation and peak memory function.

Features

¡ñ 5.7 inch, VGA color TFT display and LEMO/BNC probe connector.

¡ñ Wide measurement range from 1-10000 mm.

¡ñ Precise and stable horizontal and vertical linearity with horizontal linearity 0.1% and vertical linearity 2%.

¡ñ DAC¡¢AVG ¡¢DGS curves and defect echo help to evaluate defect equivalent calculation.

¡ñ Simultaneous display of high resolution A-scan and B-scan waveform.

¡ñ Four ways to present waveform: positive half-wave, negative half- wave, full wave and radio frequency.


¡ñ Automatic gain adjustment, defect equivalent calculation and peak memory function.

¡ñ Two individual gates setting and alarming function.


¡ñ Gate measurement includes echo amplitude, beam path, depth, projection and so on.

¡ñ Waveform freeze available£ºin full ,peak, comparative and envelope ways.

¡ñ 50 detecting channels are available with separate detecting parameters and DAC (Distance Amplitude Correction) curves in every channel.

¡ñ Adjustable high performance square wave pulse generator

¡ñ Three detecting modes(single-probe, dual crystal probe and transmission) with automatic calibration function.

¡ñ Connected to PC via USB interface with advanced software for data analysis and management.

¡ñ Super large memory, 1000 waveform and 4X2000 frame dynamic waveform diagrams can be stored, with the function of storage, checkout and review of channel, waveform, dynamic records.

¡ñ Flaw detection report printable.

Technical Specification

Beijing TIME High Technology Ltd.

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